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Big GCVAE: decision-making with adaptive transformer model for failure root cause analysis in semiconductor industry

Leveraging Pre-trained Models for Failure Analysis Triplets Generation

Natural language processing (NLP) and association rules (AR)-based knowledge extraction for intelligent fault analysis: a case study in semiconductor industry

GCVAE: Generalized-Controllable Variational AutoEncoder

Unsupervised approach for an optimal representation of the latent space of a failure analysis dataset

Intelligent Fault Analysis Decision Flow in Semiconductor Industry 4.0 Using Natural Language Processing with Deep Clustering